CTO Steve DeDera was pleased to have been a direct attendee and contributor to this invited ISO expert Working Group. This was a tri-annual expert Working Group 1 meeting recently held in Regensburg, Germany. Working Group 1 primarily focuses on Magnetic Stripe, Contact and Contactless Chip, Personalization, Physical Characteristics, Card Durability as well as the associated Test Methods for Cards and Passports.
The June meeting focused on:
Regulating the peel strength test
The second edition of the Card Service Life standard
New ESD (electric static discharge) test methods